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Recent content by weisusu

  1. weisusu

    Calculated Feature: Gage R&R?

    -I need to measure a gap feature of an assembly. The gap specification is 0.010" +/- 0.002". The gap feature cannot be directly measured without cross-sectioning (destructive). -One potential way to calculate the gap is to measure length of two components of the assembly. The difference...
  2. weisusu

    Bias Study of a Measurement System

    Hi There: We did a bias study on a CMM machine using the reference value representing the expected range for the parts that are measured. The average bias is -0.0002" or 16% of the process variation (total variation row of the Study Var (6*SD) column from Gage R&R study). The P-value for the...
  3. weisusu

    GRR and Set-Up Process

    Hello All: I am working on the set-up of a machining process in order to meet 0.30000" inner diameter with +/- 0.000080" tolerance. The plan is to measure the inner diameter with CMM. The following tasks were performed. (1) Performed a repeatability study using a ring gage on the CMM...
  4. weisusu

    Surface Profile Gage R&R Study

    Hi there. Have anyone done a Gage R&R study for surface profile for instance 0.005"|A|B|C? Would you use the min deviation, maximum deviation, or 2X worst case deviation as the response for the Gage R&R study? Any thoughts is greatly appreciated.
  5. weisusu

    Gage R&R: Surface Profile

    Traditionally a non GRR is performed using n=10 parts, three operators, and three trials. For a GRR for surface profile, would you use the same set-up as mentioned previously and the response measured would be the maximum or minimum deviation? To calculate % tolerance, the 6-sigma of measurement...
  6. weisusu

    Surface Profile: Process Capability

    Kenat: I agree that fundamentally the surface needs to fall in the specified zone. But my question pertains to measurement of process capability/performance given use of surface profile to simultaneously control location, form, and orientation. I may be able to use all + dev and - dev and...
  7. weisusu

    Surface Profile: Process Capability

    Surface profile can be used to simultaneously control different geometric tolerances. For instance 0.002"|A|B can be used to control form, location, and position. How would you address process performance/capability of such GDT callout? How would you know that you need to improve location but...
  8. weisusu

    Sampling of 5 lobe circle

    Any thoughts on the method to determine a sampling method in measuring a 5 lobe circle? In other words, I would like to determine min # of point to measure a 5 lobe circle using laser micrometer/CMM such that the sampling method is capable of detecting lobe amplitude with high %. Thanks.
  9. weisusu

    # Points to Establish Maximum Inscribed Diameter

    Hell All: I am going to conduct a Gage R&R study on CMM touch probe machine (software is PC-DIMS). The feature that will be measured is maximum inscribed diameter, which is tricky depending on the spots on the circle where the points are obtained. How do you determine a sufficient/adequate...
  10. weisusu

    Outer Diameter Measurement with tight Tolerance

    Hello unclesyd: Thanks for getting back to me. My I know what measurement method you use to measure 0.000002 on a broach? I am dealing with an assembly with tight OD and ID tolerance such as +/- 0.00006. With this tight of tolerance, best fit OD and ID do not ensure assemblility of the OD...
  11. weisusu

    Surface Rougness Cutoff Length

    To determine a cutoff length for surface roughness measurement, the idea is to exclude waviness in the surface roughness measurement. But, how can in determine what cutoff length to use? Thanks
  12. weisusu

    Surface Profile Comparison

    I am working on a heat treatment project which require a comparison of a profile measurement of a surface before and after the heat treatment process. How can I perform a statistical analysis to compare the profile of a surface before and after?
  13. weisusu

    Datum Definition and Datum Usage

    Yes RFS is defined in Datum B FCF. The drawing define a feature with its FCF relates to Datum B, but the modifier for Datum B calls out MMC. Just curious if that is a correct call out.
  14. weisusu

    Datum Definition and Datum Usage

    If an ID is defined as Datum B with RFS on a drawing, can the Datum B be used as a secondary datum for a different feature on the same drawing with MMC call out for Datum B?
  15. weisusu

    Load vs Extension Curves Comparison

    I am comparing two designs by evaluating the load vs extension curves. I want to show that the new design is equivalent or better than the old design. How can I accomplish the comparision by comparing two load vs extension curves?

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